High speed test structures for in-line process monitoring and model calibration
- Mark Ketchen
- Manjul Bhushan
- et al.
- 2005
- ICMTS 2005
Conference paper
Publications
150 results for Mark B. Ketchen
Switching delay variability in NMOS and PMOS PDSOI passgate circuits
- Mark Ketchen
- Manjul Bhushan
- et al.
- 2005
- VLSI Technology 2005
Conference paperGeneralized thermal analysis of hotspots on a high power density microprocessor chip
- Kai Xiu
- Mark Ketchen
- 2005
- ECTC 2005
Conference paperThermal modeling of a small extreme power density macro on a high power density microprocessor chip in the presence of realistic packaging and interconnect structures
- Kai Xiu
- Mark Ketchen
- 2004
- ECTC 2004
Conference paperTechnique for rapid, in-line characterization of switching history in partially depleted SOI technologies
- Dale J. Pearson
- Mark B. Ketchen
- et al.
- 2004
- IEEE International SOI Conference 2004
Conference paperAggressively scaled (0.143 μm 2) 6T-SRAM cell for the 32 nm node and beyond
- D. Fried
- J. Hergenrother
- et al.
- 2004
- IEDM 2004
Conference paperBody voltage and history effect sensitivity to key device parameters in 90nm PD-SOI
- S. Kawanaka
- M.B. Ketchen
- et al.
- 2004
- IEEE International SOI Conference 2004
Conference paperDevelopment of superconducting bandpass delta-sigma analog-to-digital converter
- John F. Bulzacchelli
- Hae-Seung Lee
- et al.
- 2004
- Physica C: Superconductivity and its Applications
Conference paperTesting and diagnostics of CMOS circuits using light emission from off-state leakage current
- Franco Stellari
- Peilin Song
- et al.
- 2004
- IEEE Transactions on Electron Devices
PaperHierarchical thermal modeling for SOI technology
- Kai Xiu
- Mark Ketchen
- 2004
- SEMI-THERM 2004
Conference paper