Photon emission microscopy of inter/intra chip device performance variations
- S. Polonsky
- M. Bhushan
- et al.
- 2005
- ESREF 2005
Conference paper
Publications
32 results for Manjul Bhushan
Technique for rapid, in-line characterization of switching history in partially depleted SOI technologies
- Dale J. Pearson
- Mark B. Ketchen
- et al.
- 2004
- IEEE International SOI Conference 2004
Conference paperBody voltage and history effect sensitivity to key device parameters in 90nm PD-SOI
- S. Kawanaka
- M.B. Ketchen
- et al.
- 2004
- IEEE International SOI Conference 2004
Conference paperCircuit and technique for characterizing switching delay history effects in silicon-on-insulator logic gates
- Mark B. Ketchen
- Manjul Bhushan
- et al.
- 2004
- Review of Scientific Instruments
PaperAnomalous History Behavior in Stacked PD SOI Gates
- Mark B. Ketchen
- Manjul Bhushan
- 2003
- IEEE International SOI Conference 2003
Conference paperDirect imaging of integer and half-integer josephson vortices in high- tc grain boundaries
- J.R. Kirtley
- C.C. Tsuei
- et al.
- 1996
- Physical Review Letters
PaperHigh-speed single-flux-quantum circuit using planarized niobium-trilayer Josephson junction technology
- P.I. Bunyk
- A. Oliva
- et al.
- 1995
- Applied Physics Letters
PaperUltra-high-speed rapid single-flux-quantum digital circuits using a planarized-niobium-trilayer Josephson junction technology
- P.I. Bunyk
- V.K. Semenov
- et al.
- 1994
- DRC 1994
Conference paperDegradation of superconducting tunnel junction characteristics with increasing barrier transparency
- A.W. Kleinsasser
- F. Rammo
- et al.
- 1993
- Applied Physics Letters
PaperOctagonal Washer De Squids and Integrated Susceptometers Fabricated in a Planarized Sub-^Im Nb - A10X - Nb Technology
- M.B. Ketchen
- D.J. Pearson
- et al.
- 1993
- IEEE TAS
Paper