Observation of change in the oxidation state at ferromagnet/insulator interface upon thermal annealing
- L. Seve
- W. Zhu
- et al.
- 2001
- Europhysics Letters
Paper
Publications
3 results for W. Zhu
Field cooling induced changes in the antiferromagnetic structure of NiO films
- W. Zhu
- L. Seve
- et al.
- 2001
- Physical Review Letters
PaperDetermination of the thickness of Al oxide films used as barriers in magnetic tunneling junctions
- W. Zhu
- C.J. Hirschmugl
- et al.
- 2001
- Applied Physics Letters
Paper