On the retention time distribution of dual-channel vertical DRAM technologies
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- Y. Li
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- 2003
- VLSI-TSA 2003
Conference paper
Publications
4 results for P. Poechmueller
Fault-tolerant designs for 256 Mb DRAM
- Toshiaki Kirihata
- Yohji Watanabe
- et al.
- 1996
- IEEE Journal of Solid-State Circuits
PaperA 286 mm2 256 Mb DRAM with ×32 both-ends DQ
- Yohji Watanabe
- Hing Wong
- et al.
- 1996
- IEICE Transactions on Electronics
PaperFault-tolerant designs for 256 Mb DRAM
- Toshiaki Kirihata
- Yohji Watanabe
- et al.
- 1996
- IEICE Transactions on Electronics
Paper