Flexible test mode approach for 256-Mb DRAM
- Toshiaki Kirihata
- Hing Wong
- et al.
- 1997
- IEEE Journal of Solid-State Circuits
Paper
Publications
5 results for Munehiro Yoshida
Flexible test mode design for DRAM characterization
- H. Wong
- T. Kirihata
- et al.
- 1996
- VLSI Circuits 1996
Conference paperFault-tolerant designs for 256 Mb DRAM
- Toshiaki Kirihata
- Yohji Watanabe
- et al.
- 1996
- IEEE Journal of Solid-State Circuits
PaperA 286 mm2 256 Mb DRAM with ×32 both-ends DQ
- Yohji Watanabe
- Hing Wong
- et al.
- 1996
- IEICE Transactions on Electronics
PaperFault-tolerant designs for 256 Mb DRAM
- Toshiaki Kirihata
- Yohji Watanabe
- et al.
- 1996
- IEICE Transactions on Electronics
Paper