The dawn of predictive chip yield design: Along and beyond the memory lane
- Rajiv Joshi
- Rouwaida Kanj
- et al.
- 2010
- IEEE Design and Test of Computers
Paper
Publications
216 results for Rajiv V. Joshi
Statistical leakage modeling for accurate yield analysis: The CDF matching method and its alternatives
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2010
- ISLPED 2010
Conference paperFinFET SRAM design
- Rajiv Joshi
- Keunwoo Kim
- et al.
- 2010
- VLSID/Embedded 2010
Conference paperStatistical-aware designs for the nm era
- Rajiv Joshi
- Rouwaida Kanj
- 2009
- ICICDT 2009
Conference paperAn elegant hardware-corroborated statistical repair and test methodology for conquering aging effects
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2009
- ICCAD 2009
Conference paperStatistical yield analysis of silicon-on-insulator embedded DRAM
- R. Kanj
- R.V. Joshi
- et al.
- 2009
- ISQED 2009
Conference paperThe Impact of BEOL Lithography Effects on the SRAM Cell Performance and Yield
- Ying Zhou
- Rouwaida Kanj
- et al.
- 2009
- ISQED 2009
Conference paperDesign of sub-90 nm low-power and variation tolerant PD/SOI SRAM cell based on dynamic stability metrics
- Rajiv V. Joshi
- Saibal Mukhopadhyay
- et al.
- 2009
- IEEE Journal of Solid-State Circuits
PaperRoot-finding methods for assessing SRAM stability in the presence of random dopant fluctuations
- Rouwaida Kanj
- Zhuo Li
- et al.
- 2009
- IEEE Trans Semicond Manuf
PaperEvaluation and alleviation of SOI impacts on SRAM functionality and yield
- Antonio R. Pelella
- Rajiv Joshi
- et al.
- 2008
- IEEE International SOI Conference 2008
Conference paper