SRAM methodology for yield and power efficiency: Per-element selectable supplies and memory reconfiguration schemes
- Rouwaida Kanj
- Rajiv V. Joshi
- et al.
- 2008
- ISLPED 2008
Conference paper
Publications
216 results for Rajiv V. Joshi
A root-finding method for assessing SRAM stability
- Rouwaida Kanj
- Zhuo Li
- et al.
- 2008
- ISQED 2008
Conference paperStatistical evaluation of split gate opportunities for improved 8T/6T column-decoupled SRAM cell yield
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2008
- ISQED 2008
Conference paperVariability analysis for sub-100nm PD/SOI sense-amplifier
- Saibal Mukhopadhyay
- Rajiv V. Joshi
- et al.
- 2008
- ISQED 2008
Conference paperThe impact of aging effects and manufacturing variation on SRAM soft-error rate
- Ethan H. Cannon
- A.J. KleinOsowski
- et al.
- 2008
- IEEE T-DMR
PaperDesign considerations for PD/SOI SRAM: Impact of gate leakage and threshold voltage variation
- Rouwaida Kanj
- Rajiv V. Joshi
- et al.
- 2008
- IEEE Trans Semicond Manuf
PaperA floating-body dynamic supply boosting technique for low-voltage sram in nanoscale PD/SOI CMOS technologies
- Rajiv Joshi
- Rouwaida Kanj
- et al.
- 2007
- ISLPED 2007
Conference paperLeakage analysis for FinFET devices using self-consistent electro-thermal modeling
- Satish Kumar
- Rajiv V. Joshi
- et al.
- 2007
- ICICDT 2007
Conference paperSRAM yield sensitivity to supply voltage fluctuations and its implications on Vmin
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2007
- ICICDT 2007
Conference paperPhonon Boltzmann transport based electro-thermal analysis of nano-scale asymmetrical double-gate finfet device
- Chunjian Ni
- Rajiv V. Joshi
- et al.
- 2007
- ASME Electronic and Photonics Packaging Division 2007
Conference paper