Measurement and analysis of gate-induced drain leakage in short-channel strained silicon germanium-on-insulator pMOS FinFETs
- Karthik Balakrishnan
- Pouya Hashemi
- et al.
- 2014
- DRC 2014
Conference paper
Publications
30 results for Karthik Balakrishnan
Circuits to measure the delay variability of MOSFETs
- Karthik Balakrishnan
- Keith Jenkins
- 2014
- ICMTS 2014
Conference paperSOI FinFET versus bulk FinFET for 10nm and below
- Terence B. Hook
- F. Allibert
- et al.
- 2014
- S3S 2014
Conference paperDensity scaling with gate-all-around silicon nanowire MOSFETs for the 10 nm node and beyond
- Sarunya Bangsaruntip
- K. Balakrishnan
- et al.
- 2013
- IEDM 2013
Conference paperHigh-performance Si1-xGex channel on insulator trigate PFETs featuring an implant-free process and aggressively-scaled fin and gate dimensions
- P. Hashemi
- M. Kobayashi
- et al.
- 2013
- VLSI Circuits 2013
Conference paperExperimental analysis and modeling of self heating effect in dielectric isolated planar and fin devices
- S. Lee
- Richard A. Wachnik
- et al.
- 2013
- VLSI Technology 2013
Conference paperHigh-performance Si1-xGex channel on insulator trigate PFETs featuring an implant-free process and aggressively-scaled fin and gate dimensions
- P. Hashemi
- M. Kobayashi
- et al.
- 2013
- VLSI Technology 2013
Conference paperEfficient spatial pattern analysis for variation decomposition via robust sparse regression
- Wangyang Zhang
- Karthik Balakrishnan
- et al.
- 2013
- IEEE TCADIS
PaperSpatial variation decomposition via sparse regression
- Wangyang Zhang
- Karthik Balakrishnan
- et al.
- 2012
- ICICDT 2012
Conference paperA simple array-based test structure for the AC variability characterization of MOSFETs
- Karthik Balakrishnan
- Keith A. Jenkins
- et al.
- 2011
- ISQED 2011
Conference paper