Publications

2 results for Michael Iwatake

Application of EBIC/EBIRCH in Failure Analysis for 2nm SRAM Failures: Case Studies
- - Qianheng Du
  - Jochonia Nxumalo
  - et al.
- 2026
- ISTFA 2026
Conference paper
A BKM by Analytical TEM to Effectively Characterize Electromigration Voids versus Grain Orientations in the Integration and Evaluation of Subtractive Ru BEOL Interconnect
- - Wayne Zhao
  - Yu Zhu
  - et al.
- 2025
- M&M 2025
Conference paper