Patterned cracks improve yield in the release of compliant microdevices from silicon-on-insulator wafers
- G.C. Hill
- J.I. Padovani
- et al.
- 2011
- JMM
Paper
Publications
108 results for D. Rugar
Patterned cracks in the buried oxide layer improve yield in device release from soi wafers
- G.C. Hill
- J.I. Padovani
- et al.
- 2011
- MEMS 2011
Conference paperFrequency domain multiplexing of force signals with application to magnetic resonance force microscopy
- T.H. Oosterkamp
- Martino Poggio
- et al.
- 2010
- Applied Physics Letters
PaperIsotope-selective detection and imaging of organic nanolayers
- H.J. Mamin
- T.H. Oosterkamp
- et al.
- 2009
- Nano Letters
PaperNuclear double resonance between statistical spin polarizations
- M. Poggio
- H.J. Mamin
- et al.
- 2009
- Physical Review Letters
PaperNanoscale magnetic resonance imaging
- C.L. Degen
- M. Poggio
- et al.
- 2009
- PNAS
PaperControlled manipulation of individual vortices in a superconductor
- E.W.J. Straver
- J.E. Hoffman
- et al.
- 2008
- Applied Physics Letters
PaperAn off-board quantum point contact as a sensitive detector of cantilever motion
- M. Poggio
- M.P. Jura
- et al.
- 2008
- Nature Physics
PaperNuclear spin relaxation induced by a mechanical resonator
- C.L. Degen
- M. Poggio
- et al.
- 2008
- Physical Review Letters
PaperRole of spin noise in the detection of nanoscale ensembles of nuclear spins
- C.L. Degen
- M. Poggio
- et al.
- 2007
- Physical Review Letters
Paper