Publications

22 results for Yun-Yu Wang

Comprehensive reliability evaluation of a 90 nm CMOS technology with Cu/PECVD low-k BEOL
- - D. Edelstein
  - H.S. Rathore
  - et al.
- 2004
- IRPS 2004
Conference paper
Epitaxial La_0.67Sr_0.33MnO₃ magnetic tunnel junctions
- - X.W. Li
  - Yu Lu
  - et al.
- 1997
- Journal of Applied Physics
Paper