Publications

2 results for Patrick Breen

Open Block Characterization and Read Voltage Calibration of 3D QLC NAND Flash
- - Nikolaos Papandreou
  - Haralampos Pozidis
  - et al.
- 2020
- IRPS 2020
Conference paper
Characterization and Analysis of Bit Errors in 3D TLC NAND Flash Memory
- - Nikolaos Papandreou
  - Haralampos Pozidis
  - et al.
- 2019
- IRPS 2019
Conference paper