Leakage engineering enabling PDSOI ring oscillators operating in sub-100pA/μm Ioff regime
- Zhibin Ren
- Jin Cai
- et al.
- 2011
- CSTIC 2011
Conference paper
Publications
123 results for Tak H. Ning
Stacked devices for SEU immune design
- Phil Oldiges
- Kenneth P. Rodbell
- et al.
- 2010
- IEEE International SOI Conference 2010
Conference paperTechnologies to further reduce soft error susceptibility in SOI
- P. Oldiges
- R.H. Dennard
- et al.
- 2009
- IEDM 2009
Conference paperSOI series MOSFET for embedded high voltage applications and soft-error immunity
- Jin Cai
- Tak Ning
- et al.
- 2008
- IEEE International SOI Conference 2008
Conference paperWill SOI have a life for the low-power market?
- Jin Cai
- Zhibin Ren
- et al.
- 2008
- IEEE International SOI Conference 2008
Conference paperElectron trapping at positively charged centers in SiO2
- T.H. Ning
- C.M. Osburn
- et al.
- 2008
- Applied Physics Letters
PaperCapture cross section and trap concentration of holes in silicon dioxide
- T.H. Ning
- 2008
- Journal of Applied Physics
PaperThreshold instability in IGFET's due to emission of leakage electrons from silicon substrate into silicon dioxide
- T.H. Ning
- C.M. Osburn
- et al.
- 2008
- Applied Physics Letters
PaperHigh-field capture of electrons by Coulomb-attractive centers in silicon dioxide
- T.H. Ning
- 2008
- Journal of Applied Physics
PaperEmission probability of hot electrons from silicon into silicon dioxide
- T.H. Ning
- C.M. Osburn
- et al.
- 2008
- Journal of Applied Physics
Paper