Publications

2 results for Ch. L. N. Pavan

Characterization and Analysis of Random Telegraph Noise in Scaled SiGe Channel HKMG pMOSFETs
- - Ch. L. N. Pavan
  - Rama Divakaruni
  - et al.
- 2022
- IEEE T-ED
Paper
Analysis of systematic and random variation of gate-induced drain leakage in silicon-germanium channel pFET
- - Vishal A. Tiwari
  - Ch. L. N. Pavan
  - et al.
- 2016
- ICEE 2016
Conference paper