Charge Catastrophe and Dielectric Breakdown during Exposure of Organic Thin Films to Low-Energy Electron RadiationA. TheteDaniël Geelenet al.2017Physical Review LettersPaper
eV-TEM: Transmission electron microscopy in a low energy cathode lens instrumentDaniël GeelenA. Theteet al.2015UltramicroscopyPaper
Low-energy electron (0-100eV) interaction with resists using LEEMA. TheteDaniël Geelenet al.2015SPIE Advanced Lithography 2015Conference paper