Stress determination through diffraction: Establishing the link between Kröner and Voigt/Reuss limits
- Conal E. Murray
- Jean L. Jordan-Sweet
- et al.
- 2015
- Powder Diffraction
Paper
Publications
103 results for Stephen W. Bedell
Vertical thinking in blue light emitting diodes: GaN-on-graphene technology
- Can Bayram
- Jeehwan Kim
- et al.
- 2015
- SPIE OPTO 2015
Conference paperPrinciple of direct van der Waals epitaxy of single-crystalline films on epitaxial graphene
- Jeehwan Kim
- Can Bayram
- et al.
- 2014
- Nature Communications
PaperGate stacks for silicon, silicon germanium, and III-V channel MOSFETs
- Martin M. Frank
- Yu Zhu
- et al.
- 2014
- ECS Meeting 2014
Conference paperAdvanced flexible electronics: Challenges and opportunities
- Stephen W. Bedell
- Davood Shahrjerdi
- et al.
- 2014
- SPIE Defense + Security 2014
Conference paperStrain scaling for CMOS
- Stephen W. Bedell
- Ali Khakifirooz
- et al.
- 2014
- MRS Bulletin
PaperVertical light-emitting diode fabrication by controlled spalling
- Stephen W. Bedell
- Can Bayram
- et al.
- 2013
- Applied Physics Express
PaperObservation of semiconductor device channel strain using in-line high resolution X-ray diffraction
- Judson R. Holt
- Anita Madan
- et al.
- 2013
- Journal of Applied Physics
PaperHigh-performance Si1-xGex channel on insulator trigate PFETs featuring an implant-free process and aggressively-scaled fin and gate dimensions
- P. Hashemi
- M. Kobayashi
- et al.
- 2013
- VLSI Circuits 2013
Conference paperHigh-performance Si1-xGex channel on insulator trigate PFETs featuring an implant-free process and aggressively-scaled fin and gate dimensions
- P. Hashemi
- M. Kobayashi
- et al.
- 2013
- VLSI Technology 2013
Conference paper