The Role of Sample Geometry on Ultra-Low Alpha Particle Emissivity Measurements
- Michael S. Gordon
- Ken Rodbell
- et al.
- 2017
- IEEE TNS
Paper
Publications
3 results for Brendan D. McNally
Measurements of radioactive contaminants in semiconductor materials
- Michael S. Gordon
- Ken Rodbell
- et al.
- 2016
- Semiconductor Science and Technology
ReviewThe Role of Static Charge in Ultra-Low Alpha Particle Emissivity Measurements
- Michael. S. Gordon
- Kenneth P. Rodbell
- et al.
- 2015
- IEEE TNS
Paper