Lattice imaging of metastable TiSi2
- T.C. Chou
- C.Y. Wong
- et al.
- 1987
- Journal of Applied Physics
Paper
Publications
230 results for King-Ning Tu
Localized epitaxial growth of ReSi2 on (111) and (001) silicon
- J.J. Chu
- L.J. Chen
- et al.
- 1987
- Journal of Applied Physics
PaperNiSi2 precipitation in nickel-implanted silicon films
- R.C. Cammarata
- C.V. Thompson
- et al.
- 1987
- Applied Physics Letters
PaperEffect of temperature on electrical and microstructural changes of coevaporated Ir-Si alloy films
- B.Z. Weiss
- K.N. Tu
- et al.
- 1986
- Journal of Applied Physics
PaperTitanium-tungsten contacts to silicon. II. Stability against aluminum penetration
- S.E. Babcock
- K.N. Tu
- 1986
- Journal of Applied Physics
PaperStability of oxides grown on tantalum silicide surfaces
- A. Cros
- K.N. Tu
- 1986
- Journal of Applied Physics
PaperEnhanced grain growth of phosphorus-doped polycrystalline silicon by titanium silicide formation
- T.C. Chou
- C.Y. Wong
- et al.
- 1986
- Applied Physics Letters
PaperElectrical transport properties of V3Si, V5Si3, and VSi2 thin films
- F. Nava
- O. Bisi
- et al.
- 1986
- Physical Review B
PaperSchottky-barrier heights of Ti and TiSi2 on n-type and p-type Si(100)
- M.O. Aboelfotoh
- K.N. Tu
- 1986
- Physical Review B
PaperContact for shallow junctions
- K.N. Tu
- 1986
- Thin Solid Films
Paper