A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology
- Tony Tae-Hyoung Kim
- Pong-Fei Lu
- et al.
- 2015
- IEEE Transactions on VLSI Systems
Paper
Publications
3 results for Tony Tae-Hyoung Kim
Design of ring oscillator structures for measuring isolated NBTI and PBTI
- Tony T. Kim
- Pong-Fei Lu
- et al.
- 2012
- ISCAS 2012
Conference paperReliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologies
- Jae-Joon Kim
- Barry P. Linder
- et al.
- 2011
- IRPS 2011
Conference paper