Publications

3 results for Enxia Zhang

Total ionizing dose radiation effects on 14 nm FinFET and SOI UTBB technologies
- - Harold Hughes
  - Patrick McMarr
  - et al.
- 2015
- REDW/NSREC 2015
Conference paper
Impact of technology scaling in sub-100 nm nMOSFETs on total-dose radiation response and hot-carrier reliability
- - Rajan Arora
  - Zachary E. Fleetwood
  - et al.
- 2014
- IEEE TNS
Paper
Trade-offs between RF performance and total-dose tolerance in 45-nm RF-CMOS
- - Rajan Arora
  - En Xia Zhang
  - et al.
- 2011
- IEEE TNS
Paper