Physical characterization of sub-32-nm semiconductor materials and processes using advanced ion beam-based analytical techniques
- M. Hopstaken
- D. Pfeiffer
- et al.
- 2012
- Surface and Interface Analysis
Paper
Publications
150 results for Matthew Copel
Highly efficient fluorescence quenching with graphene
- Amal Kasry
- Ali A. Ardakani
- et al.
- 2012
- Journal of Physical Chemistry C
ReviewDirect measurement of the growth mode of graphene on SiC(0001) and SiC(0001̄)
- James B. Hannon
- Matthew Copel
- et al.
- 2011
- Physical Review Letters
PaperDefects in Cu(In,Ga)Se 2 chalcopyrite semiconductors: A comparative study of material properties, defect states, and photovoltaic performance
- Qing Cao
- Oki Gunawan
- et al.
- 2011
- Advanced Energy Materials
PaperA real space investigation of the dimer defect structure of Si(001)‐(2times8)
- H. Niehus
- U.K. Köhler
- et al.
- 2011
- Journal of Microscopy
PaperBand alignment at the Cu2 ZnSn (SxSe1-x) 4 /CdS interface
- Richard Haight
- Aaron Barkhouse
- et al.
- 2011
- Applied Physics Letters
PaperMedium energy ion scattering of Gr on SiC(0001) and Si(100)
- Matthew Copel
- Satoshi Oida
- et al.
- 2011
- Applied Physics Letters
PaperMaximized benefit of LaAlO higher-κ gate dielectrics by optimizing the La/Al atomic ratio
- Hiroaki Arimura
- Stephen L. Brown
- et al.
- 2011
- IEEE Electron Device Letters
PaperElectrical and optical properties of graphene mono- and multi-layers; towards graphene-based optoelectronics
- Amal Kasry
- George Tulevski
- et al.
- 2010
- IVESC 2010
Conference paperStability of terbium scandate on Si(100)
- Matt Copel
- Nestor Bojarczuk
- et al.
- 2010
- Applied Physics Letters
Paper