Publications

2 results for Sean Carey

Characterization and exploration of latch checkers for efficient RAS protection
- - Karthik Swaminathan
  - Ramon Bertran
  - et al.
- 2023
- DSN 2023
Conference paper
Cores, Cache, Content, and Characterization: IBM’s Second Generation 14-nm Product, z15
- - David Wolpert
  - Chris Berry
  - et al.
- 2020
- IEEE JSSC
Paper