Low-energy electron microscopy contrast of stacking boundaries: Comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide
- Tobias A. De Jong
- Xingchen Chen
- et al.
- 2023
- Physical Review B
Paper
Publications
2 results for Xingchen Chen
Imaging moiré deformation and dynamics in twisted bilayer graphene
- Tobias A. de Jong
- Tjerk Benschop
- et al.
- 2022
- Nature Communications
Paper