Publications

182 results for Eduard Cartier

Characterization of the V_T-instability in SiO₂ / HfO₂ gate dielectrics
- - A. Kerber
  - E. Cartier
  - et al.
- 2003
- IRPS 2003
Conference paper
Charge trapping and dielectric reliability of SiO₂-Al₂O₃ gate stacks with TiN electrodes
- - Andreas Kerber
  - Eduard Cartier
  - et al.
- 2003
- IEEE Transactions on Electron Devices
Paper
Characterization of the V_T-instability in SIO₂/HFO₂ gate dielectrics
- - A. Kerber
  - E. Cartier
  - et al.
- 2003
- IRPS 2003
Conference paper
Origin of the threshold voltage instability in SiO₂/HfO₂ dual layer gate dielectrics
- - A. Kerber
  - E. Cartier
  - et al.
- 2003
- IEEE Electron Device Letters
Paper
Characterization of silicate/Si(001) interfaces
- - M. Copel
  - E. Cartier
  - et al.
- 2002
- Applied Physics Letters
Paper
Measurement of barrier heights in high permittivity gate dielectric films
- - S. Zafar
  - E. Cartier
  - et al.
- 2002
- Applied Physics Letters
Paper
Low Weibull slope of breakdown distributions in high-k layers
- - Thomas Kauerauf
  - Robin Degraeve
  - et al.
- 2002
- IEEE Electron Device Letters
Paper
Physical and electrical characterization of Hafnium oxide and Hafnium silicate sputtered films
- - A.C. Callegari
  - E. Cartier
  - et al.
- 2001
- Journal of Applied Physics
Paper
Effective electron mobility in Si inversion layers in metal-oxide-semiconductor systems with a high-κ insulator: The role of remote phonon scattering
- - Massimo V. Fischetti
  - Deborah A. Neumayer
  - et al.
- 2001
- Journal of Applied Physics
Paper
Imaging of oxide and interface charges in SiO₂-Si
- - R. Ludeke
  - E. Cartier
- 2001
- Microelectronic Engineering
Conference paper