Publications

4 results for B. Redder

Interconnects exhibiting enhanced electromigration short-length effects by line width variation
- - Ronald Filippi
  - P.-C. Wang
  - et al.
- 2014
- IRPS 2014
Conference paper
Optical nanoprobe electrical microscopy
- - Stephen Ippolito
  - Michael Tenney
  - et al.
- 2013
- ISTFA 2013
Conference paper
The effect of a threshold failure time and bimodal behavior on the electromigration lifetime of copper interconnects
- - R. Filippi
  - P.-C. Wang
  - et al.
- 2009
- IRPS 2009
Conference paper
Comparison of electromigration in Cu interconnects with atomic-layer- or physical-vapor-deposited TaN liners
- - C.-K. Hu
  - L. Gignac
  - et al.
- 2007
- JES
Paper