Publications

6 results for J. Demeulemeester

On the formation and structural properties of hexagonal rare earth (Y, Gd, Dy, Er and Yb) disilicide thin films
- - F.A. Geenen
  - W. Knaepen
  - et al.
- 2014
- Journal of Alloys and Compounds
Paper
In situ study of the formation of silicide phases in amorphous Co-Si mixed layers
- - C. Van Bockstael
  - K. De Keyser
  - et al.
- 2010
- Microelectronic Engineering
Paper
In situ X-ray diffraction study of thin film Ir/Si solid state reactions
- - W. Knaepen
  - J. Demeulemeester
  - et al.
- 2010
- Microelectronic Engineering
Paper
In situ x-ray diffraction study of Ni-Yb interlayer and alloy systems on Si(100)
- - W. Knaepen
  - J. Demeulemeester
  - et al.
- 2009
- JVSTA
Paper
Simultaneous real-time x-ray diffraction spectroscopy, Rutherford backscattering spectrometry, and sheet resistance measurements to study thin film growth kinetics by Kissinger plots
- - D. Smeets
  - J. Demeulemeester
  - et al.
- 2008
- Journal of Applied Physics
Paper
Nucleation and diffusion during growth of ternary Co1-x Nix Si2 thin films studied by complementary techniques in real time
- - D. Smeets
  - J. Demeulemeester
  - et al.
- 2008
- Journal of Applied Physics
Paper