Low-energy electron microscopy contrast of stacking boundaries: Comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide
- Tobias A. De Jong
- Xingchen Chen
- et al.
- 2023
- Physical Review B
Paper
Publications
36 results for Sense Jan van der Molen
Electron transmission and mean free path in molybdenum disulfide at electron-volt energies
- Peter S. Neu
- Makars Šiškins
- et al.
- 2023
- Physical Review B
PaperImaging moiré deformation and dynamics in twisted bilayer graphene
- Tobias A. de Jong
- Tjerk Benschop
- et al.
- 2022
- Nature Communications
PaperLow-Energy Electron Irradiation Damage in Few-Monolayer Pentacene Films
- A. Tebyani
- F.B. Baalbergen
- et al.
- 2021
- Journal of Physical Chemistry C
PaperOptical Near-Field Electron Microscopy
- Raphaël Marchand
- Radek Šachl
- et al.
- 2021
- Physical Review Applied
PaperComplementary LEEM and eV-TEM for imaging and spectroscopy
- Peter S. Neu
- Daniël Geelen
- et al.
- 2021
- Ultramicroscopy
PaperQuantitative analysis of spectroscopic low energy electron microscopy data: High-dynamic range imaging, drift correction and cluster analysis
- T. A. de Jong
- D. N.L. Kok
- et al.
- 2020
- Ultramicroscopy
PaperKey Role of Very Low Energy Electrons in Tin-Based Molecular Resists for Extreme Ultraviolet Nanolithography
- Ivan Bespalov
- Yu Zhang
- et al.
- 2020
- ACS AMI
PaperNonuniversal Transverse Electron Mean Free Path through Few-layer Graphene
- Daniël Geelen
- J. Jobst
- et al.
- 2019
- Physical Review Letters
PaperQuantifying work function differences using low-energy electron microscopy: The case of mixed-terminated strontium titanate
- J. Jobst
- Laurens M. Boers
- et al.
- 2019
- Ultramicroscopy
Paper