Publications

2 results for Alberto Cestero

Application of EBIC/EBIRCH in Failure Analysis for 2nm SRAM Failures: Case Studies
- - Qianheng Du
  - Jochonia Nxumalo
  - et al.
- 2026
- ISTFA 2026
Conference paper
Optimization of 3nm High Performance Nanosheet Technology for 77 K Operation
- - Julien Frougier
  - Ruqiang Bao
  - et al.
- 2025
- GOMACTech 2025
Conference paper