Steady state and pulsed bias stress induced degradation in amorphous silicon thin film transistors for active-matrix liquid crystal displays
- Frank R. Libsch
- 1992
- IEDM 1992
Conference paper
Publications
65 results for Frank Libsch
Bias-stress-induced stretched-exponential time dependence of charge injection and trapping in amorphous silicon thin-film transistors
- Frank R. Libsch
- Jerzy Kanicki
- 1992
- SSDM 1992
Conference paperRole of charge transport and trapping in the reliability of submicron polysilicon thin film transistors
- Frank R. Libsch
- Catherine Y. Wong
- et al.
- 1991
- IEDM 1991
Conference paperPerformance of thin hydrogenated amorphous silicon thin-film transistors
- Jerzy Kanicki
- Frank R. Libsch
- et al.
- 1991
- Journal of Applied Physics
PaperModeling and parameter extraction of amorphous silicon thin-film-transistors for active-matrix liquid-crystal displays
- R.R. Troutman
- Frank R. Libsch
- 1990
- IEDM 1990
Conference paper