Publications

3 results for Kurt A. Moen

An investigation of single event transient response in 45-nm and 32-nm SOI RF-CMOS devices and circuits
- - Troy D. England
  - Rajan Arora
  - et al.
- 2013
- IEEE TNS
Paper
Evaluating the influence of various body-contacting schemes on single event transients in 45-nm SOI CMOS
- - Kurt A. Moen
  - Stanley D. Phillips
  - et al.
- 2010
- IEEE TNS
Paper
Heavy ion microbeam-and broadbeam-induced transients in SiGe HBTs
- - Jonathan A. Pellish
  - Robert A. Reed
  - et al.
- 2009
- IEEE TNS
Paper