Publications

2 results for Dong-Il Bae

Bottom oxidation through STI (BOTS) - A novel approach to fabricate dielectric isolated FinFETs on bulk substrates
- - K. Cheng
  - S.-C. Seo
  - et al.
- 2014
- VLSI Technology 2014
Conference paper
Investigation of fixed oxide charge and fin profile effects on bulk FinFET device characteristics
- - Bomsoo Kim
  - Dong-Il Bae
  - et al.
- 2013
- IEEE Electron Device Letters
Paper