Publications

2 results for Sandip De

Modeling and characterization of gate leakage in high-K metal gate technology-Based embedded DRAM
- - Mohit Bajaj
  - Rajan K. Pandey
  - et al.
- 2013
- IEEE T-ED
Paper
Characterization and optimization of charge trapping in high-k dielectrics
- - Eduard Cartier
  - Takashi Ando
  - et al.
- 2013
- IRPS 2013
Conference paper