Publications

4 results for Puneet Goyal

Modeling and characterization of gate leakage in high-K metal gate technology-Based embedded DRAM
- - Mohit Bajaj
  - Rajan K. Pandey
  - et al.
- 2013
- IEEE T-ED
Paper
Performance analysis and modeling of deep trench decoupling capacitor for 32 nm high-performance SOI processors and beyond
- - Balaji Jayaraman
  - Sneha Gupta
  - et al.
- 2012
- ICICDT 2012
Conference paper
Characterization of novel TiN/HfO₂ metal insulator semiconductor stack for 32nm eDRAM
- - Puneet Goyal
  - Sneha Gupta
  - et al.
- 2010
- IEEE International SOI Conference 2010
Conference paper
A 0.039um² high performance eDRAM cell based on 32nm high-K/metal SOI technology
- - Nauman Z. Butt
  - Kevin McStay
  - et al.
- 2010
- IEDM 2010
Conference paper