Chips at Work: Picosecond Imaging Circuit Analysis
- J.A. Kash
- J.C. Tsang
- 1999
- UEO 1999
Conference paper
Publications
168 results for Jeffrey A. Kash
Diagnosis and characterization of timing-related defects by time-dependent light emission
- D.R. Knebel
- P.N. Sanda
- et al.
- 1998
- IEEE ITC 1998
Conference paperBackside optical emission diagnostics for excess IDDQ
- J.A. Kash
- J.C. Tsang
- et al.
- 1998
- IEEE Journal of Solid-State Circuits
PaperDynamic internal testing of CMOS circuits using hot luminescence
- J.A. Kash
- J.C. Tsang
- 1997
- IEEE Electron Device Letters
PaperTemporal characterization of CMOS circuits by time resolved emission microscopy
- J.C. Tsang
- J.A. Kash
- 1997
- DRC 1997
Conference paperOptical imaging of picosecond switching in CMOS circuits
- J.A. Kash
- J.C. Tsang
- 1997
- CLEO 1997
Conference paperBackside optical emission diagnostics for excess IDDQ
- J.A. Kash
- J.C. Tsang
- et al.
- 1997
- CICC 1997
Conference paperTemperature evolution of excitonic luminescence in nitrogen doped zinc selenide
- C. Kothandaraman
- G.F. Neumark
- et al.
- 1997
- Applied Physics Letters
PaperPicosecond hot electron light emission from submicron complementary metal-oxide-semiconductor circuits
- J.C. Tsang
- J.A. Kash
- 1997
- Applied Physics Letters
PaperHot luminescence from CMOS circuits: A picosecond probe of internal timing
- J.A. Kash
- J.C. Tsang
- 1997
- physica status solidi (b)
Paper