First Experimental Demonstration of MRAM Data Scrubbing: 80 Mb MRAM with 40 nm junctions for Last Level Cache Applications
- H. Wu
- V. Katragadda
- et al.
- 2021
- IEDM 2021
Conference paper
Publications
3 results for Veenadhar Katragadda
Introduction to Analog Testing of Resistive Random Access Memory (RRAM) Devices towards Scalable Analog Compute Technology for Deep Learning
- Ruturaj Pujari
- Arthur Gasasira
- et al.
- 2021
- ASMC 2021
Conference paperA 14 nm embedded STT-MRAM CMOS technology
- Daniel C. Edelstein
- M. Rizzolo
- et al.
- 2020
- IEDM 2020
Conference paper