Publications

3 results for Nauman Z. Butt

Modeling and analysis of transistor mismatch due to variability in short-channel effect induced by random dopant fluctuation
- - Nauman Z. Butt
  - Jeffrey B. Johnson
- 2012
- IEEE Electron Device Letters
Paper
A 0.039um² high performance eDRAM cell based on 32nm high-K/metal SOI technology
- - Nauman Z. Butt
  - Kevin McStay
  - et al.
- 2010
- IEDM 2010
Conference paper
Scaling deep trench based eDRAM on SOI to 32nm and beyond
- - G. Wang
  - D. Anand
  - et al.
- 2009
- IEDM 2009
Conference paper