Publications

4 results for M. Yamaoka

Statistical measurement of random telegraph noise and its impact in scaled-down high-κ/metal-gate MOSFETs
- - H. Miki
  - N. Tega
  - et al.
- 2012
- IEDM 2012
Conference paper
Voltage and temperature dependence of random telegraph noise in highly scaled HKMG ETSOI nFETs and its impact on logic delay uncertainty
- - H. Miki
  - M. Yamaoka
  - et al.
- 2012
- VLSI Technology 2012
Conference paper
Evaluation methodology for random telegraph noise effects in SRAM arrays
- - M. Yamaoka
  - Hiroshi Miki
  - et al.
- 2011
- IEDM 2011
Conference paper
Understanding short-term BTI behavior through comprehensive observation of gate-voltage dependence of RTN in highly scaled high-κ / metal-gate pFETs
- - Hiroshi Miki
  - M. Yamaoka
  - et al.
- 2011
- VLSI Technology 2011
Conference paper