Publications

2 results for S. Wu

Statistical measurement of random telegraph noise and its impact in scaled-down high-κ/metal-gate MOSFETs
- - H. Miki
  - N. Tega
  - et al.
- 2012
- IEDM 2012
Conference paper
Evaluation methodology for random telegraph noise effects in SRAM arrays
- - M. Yamaoka
  - Hiroshi Miki
  - et al.
- 2011
- IEDM 2011
Conference paper