Characterization of silicide-silicon interface contact resistivity using 1-D dual transmission line model approximation of modified cross bridge kelvin measurements
- Ankur Arya
- Balaji Jayaraman
- et al.
- 2011
- IWPSD 2011
Conference paper
Publications
3 results for Ankur Arya
Leakage issues in failure analysis of P+ SiGe active area short monitor
- Ankur Arya
- Greg M. Johnson
- et al.
- 2011
- IPFA 2011
Conference paperCharacterization of novel TiN/HfO2 metal insulator semiconductor stack for 32nm eDRAM
- Puneet Goyal
- Sneha Gupta
- et al.
- 2010
- IEEE International SOI Conference 2010
Conference paper