Raman Spectroscopy of Silicide Formation at the Pt/Crystalline Si Interface
- J.C. Tsang
- G.W. Rubloff
- et al.
- 1984
- JVSTA
Paper
Publications
135 results for James C. Tsang
Charge transport and trapping phenomena in off-stoichiometric silicon dioxide films
- D.J. DiMaria
- D.W. Dong
- et al.
- 1983
- Journal of Applied Physics
PaperLimit on short-range resonant-charge-transfer contribution to surface-enhanced Raman scattering
- S.S. Jha
- J.C. Tsang
- 1983
- Physical Review B
PaperHot-electron picture of light emission from tunnel junctions
- J.R. Kirtley
- T.N. Theis
- et al.
- 1983
- Physical Review B
PaperSummary Abstract: Multichannel Raman spectroscopy of molecules on metal films and tunnel junctions
- Ph. Avouris
- J.C. Tsang
- et al.
- 1983
- JVSTA
PaperMultichannel Raman spectroscopy of molecules on evaporated metal films
- J.C. Tsang
- Ph. Avouris
- et al.
- 1983
- Chemical Physics Letters
PaperMultichannel Raman spectroscopy of unroughened noble metal and non-noble metal films and tunnel junctions
- J.C. Tsang
- Ph. Avouris
- et al.
- 1983
- Journal of Electron Spectroscopy and Related Phenomena
PaperThe dependence of inelastic electron tunneling on junction roughness
- P. Varker
- J.R. Kirtley
- et al.
- 1983
- Solid State Communications
PaperRaman spectroscopy of molecular monolayers without giant field enhancements
- J.C. Tsang
- Ph. Avouris
- et al.
- 1983
- The Journal of Chemical Physics
PaperSurface-enhanced Raman scattering from molecules in tunnel junctions
- J.C. Tsang
- J.R. Kirtley
- et al.
- 1982
- Physical Review B
Paper