Backside optical emission diagnostics for excess IDDQ
- J.A. Kash
- J.C. Tsang
- et al.
- 1997
- CICC 1997
Conference paper
Publications
135 results for James C. Tsang
Picosecond hot electron light emission from submicron complementary metal-oxide-semiconductor circuits
- J.C. Tsang
- J.A. Kash
- 1997
- Applied Physics Letters
PaperLight emission during direct and Fowler-Nordheim tunneling in ultra thin MOS tunnel junctions
- E. Cartier
- J.C. Tsang
- et al.
- 1997
- Microelectronic Engineering
PaperHot luminescence from CMOS circuits: A picosecond probe of internal timing
- J.A. Kash
- J.C. Tsang
- 1997
- physica status solidi (b)
PaperFull Chip Optical Imaging of Logic State Evolution in CMOS Circuits
- J.A. Kash
- J.C. Tsang
- 1996
- IEDM 1996
Conference paperMeasurements of alloy composition and strain in thin GexSi 1-x layers
- J.C. Tsang
- P.M. Mooney
- et al.
- 1994
- Journal of Applied Physics
PaperSurfactant-mediated growth of Ge on Si(111)
- M. Horn-Von Hoegen
- M. Copel
- et al.
- 1994
- Physical Review B
PaperInterfacial microstructures of ultrathin Ge layers on Si probed by x-ray scattering and fluorescence yield
- Z.H. Ming
- Y.L. Soo
- et al.
- 1994
- Applied Physics Letters
PaperSpatially resolved Raman spectroscopy of a step graded Ge xSi1-x strain relief structure
- J.C. Tsang
- F.H. Dacol
- et al.
- 1993
- Applied Physics Letters
PaperRaman scattering analysis of relaxed GexSi1-x alloy layers
- P.M. Mooney
- F.H. Dacol
- et al.
- 1993
- Applied Physics Letters
Paper