Publications

4 results for Phil Nigh

Using well/substrate bias manipulation to enhance voltage-test-based defect detection
- - Anne Gattiker
  - Phil Nigh
- 2011
- IEEE ITC 2011
Conference paper
Random and systematic defect analysis using IDDQ signature analysis for understanding fails and guiding test decisions
- - Phil Nigh
  - Anne Gattiker
- 2004
- IEEE ITC 2004
Conference paper
Current-Signature-Based Analysis of Complex Test Fails
- - Anne Gattiker
  - Phil Nigh
  - et al.
- 1999
- ISTFA 1999
Conference paper
Diagnosis and characterization of timing-related defects by time-dependent light emission
- - D.R. Knebel
  - P.N. Sanda
  - et al.
- 1998
- IEEE ITC 1998
Conference paper