Using well/substrate bias manipulation to enhance voltage-test-based defect detectionAnne GattikerPhil Nigh2011IEEE ITC 2011Conference paper
Random and systematic defect analysis using IDDQ signature analysis for understanding fails and guiding test decisionsPhil NighAnne Gattiker2004IEEE ITC 2004Conference paper
Current-Signature-Based Analysis of Complex Test FailsAnne GattikerPhil Nighet al.1999ISTFA 1999Conference paper
Diagnosis and characterization of timing-related defects by time-dependent light emissionD.R. KnebelP.N. Sandaet al.1998IEEE ITC 1998Conference paper