Publications

12 results for Jun Yuan

Stress proximity technique for performance improvement with dual stress liner at 45nm technology and beyond
- - X. Chen
  - S. Fang
  - et al.
- 2006
- VLSI Technology 2006
Conference paper
Process induced stress for CMOS performance improvement
- - S. Fang
  - S.S. Tan
  - et al.
- 2006
- ICSICT 2006
Conference paper