Publications

2 results for J. Ervin

A 0.039um² high performance eDRAM cell based on 32nm high-K/metal SOI technology
- - Nauman Z. Butt
  - Kevin McStay
  - et al.
- 2010
- IEDM 2010
Conference paper
Scaling deep trench based eDRAM on SOI to 32nm and beyond
- - G. Wang
  - D. Anand
  - et al.
- 2009
- IEDM 2009
Conference paper