CAD for double patterning lithography
- David Z. Pan
- Jae-Seok Yang
- et al.
- 2010
- ICICDT 2010
Conference paper
Publications
5 results for Kun Yuan
Manufacturability aware routing in nanometer VLSI
- David Z. Pan
- Minsik Cho
- et al.
- 2010
- Foundations and Trends in Electronic Design Automation
PaperLayout optimizations for double patterning lithography
- David Z. Pan
- Jae-Seok Yang
- et al.
- 2009
- ASICON 2009
Conference paperELIAD: Efficient Lithography Aware Detailed routing algorithm with compact and macro post-OPC printability prediction
- Minsik Cho
- Kun Yuan
- et al.
- 2009
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
PaperELIAD: Efficient lithography aware detailed routing algorithm with compact and macro post-OPC printability prediction
- Minsik Cho
- Kun Yuan
- et al.
- 2009
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Paper