Aberration correction results in the IBM STEM instrument
- P.E. Batson
- 2003
- Ultramicroscopy
Conference paper
Publications
89 results for Philip E. Batson
Sub-angstrom probe size in HADF-STEM at 120KV
- Philip Batson
- N. Dellby
- et al.
- 2002
- Microscopy and Microanalysis
PaperSub-aångstrom resolution using aberration corrected electron optics
- P.E. Batson
- N. Dellby
- et al.
- 2002
- Nature
PaperEffects of detector black level in ADF-STEM imaging
- Zhiheng Yu
- Philip Batson
- et al.
- 2002
- Microscopy and Microanalysis
PaperStructural and electronic characterization of a dissociated dislocation in GeSi
- P.E. Batson
- 2000
- Physical Review B - CMMP
PaperAtomic resolution analytical microscopy
- P.E. Batson
- 2000
- IBM J. Res. Dev
PaperNear-edge conduction band electronic states in SiGe alloys
- Philip E. Batson
- 2000
- Journal of Electron Microscopy
PaperAtomic resolution EELS analysis of a misfit dislocation at a GeSi/Si interface
- P.E. Batson
- 1999
- Physica B: Condensed Matter
PaperAtomic and electronic structure of a dissociated 60° misfit dislocation in GexSi(1-x)
- P.E. Batson
- 1999
- Physical Review Letters
PaperAdvanced spatially resolved EELS in the STEM
- P.E. Batson
- 1999
- Ultramicroscopy
Conference paper