Electron-energy-loss scattering near a single misfit dislocation at the GaAs/GaInAs interface
- P.E. Batson
- K.L. Kavanagh
- et al.
- 1986
- Physical Review Letters
Paper
Publications
89 results for Philip E. Batson
Arsenic segregation to silicon/silicon oxide interfaces
- C.Y. Wong
- C.R.M. Grovenor
- et al.
- 1985
- Journal of Applied Physics
PaperReactions of Pd on (100) and (110) GaAs surfaces
- T.S. Kuan
- J. Freeouf
- et al.
- 1985
- Journal of Applied Physics
PaperEffect of arsenic segregation on the electrical properties of grain boundaries in polycrystalline silicon
- C.Y. Wong
- C.R.M. Grovenor
- et al.
- 1985
- Journal of Applied Physics
PaperWIEN FILTER ENERGY LOSS SPECTROMETER FOR THE DEDICATED SCANNING TRANSMISSION ELECTRON MICROSCOPE.
- P.E. Batson
- 1985
- Scanning Electron Microscopy
PaperInelastic scattering of fast electrons in clusters of small spheres
- P.E. Batson
- 1985
- Surface Science
PaperProspects for high-resolution electron energy-loss experiments with the scanning transmission electron microscope
- P.E. Batson
- 1985
- Ultramicroscopy
PaperElemental and electronic characterization of semiconductor materials with the STEM
- P.E. Batson
- 1989
- Proceedings of SPIE 1989
Conference paperGrain boundary-solute interactions in polycrystalline silicon and germanium
- D.A. Smith
- C.R.M. Grovenor
- et al.
- 1984
- Ultramicroscopy
PaperElectron microscope studies of an alloyed Au/Ni/Au-Ge ohmic contact to GaAs
- T.S. Kuan
- P.E. Batson
- et al.
- 1983
- Journal of Applied Physics
Paper