Inference about defects in the presence of maskingBetty J. FlehingerBenjamin Reiseret al.1996TechnometricsPaper
Likelihood ratio methods for monitoring parameters of a nested random effect modelEmmanuel Yashchin1995JASAPaper
Estimating the current mean of a process subject to abrupt changesEmmanuel Yashchin1995TechnometricsPaper
Performance of cusum control schemes for serially correlated observationsEmmanuel Yashchin1993TechnometricsPaper
Analysis of cusum and other markov-type control schemes by using empirical distributionsEmmanuel Yashchin1992TechnometricsPaper