The formation of disilicides from bilayers of Ni/Co and Co/Ni on silicon: Phase separation and solid solution
- T.G. Finstad
- D.D. Anfiteatro
- et al.
- 1986
- Thin Solid Films
Paper
Publications
159 results for F.M. D'Heurle
Stacking faults in WSi2: Resistivity effects
- F.M. d'Heurle
- F.K. LeGoues
- et al.
- 1986
- Applied Physics Letters
PaperCorrelation between chemistry and the amount of mixing in bilayers submitted to ion bombardment
- F.M. D'Heurle
- J.E.E. Baglin
- et al.
- 1985
- Journal of Applied Physics
PaperA note on solid-state reaction kinetics: The formation of silicides from thin films of metallic alloys
- F.M. D'Heurle
- 1985
- Journal of Applied Physics
PaperFormation of thin films of CoSi2: Nucleation and diffusion mechanisms
- F.M. d'Heurle
- C.S. Petersson
- 1985
- Thin Solid Films
PaperReaction of silicon with films of CoNi alloys: Phase separation of the monosilicides and nucleation of the disilicides
- F.M. D'Heurle
- D.D. Anfiteatro
- et al.
- 1985
- Thin Solid Films
PaperRate of formation of silicon dioxide; Semiconducting ruthenium silicide
- F.M. D'Heurle
- R.D. Frampton
- et al.
- 1985
- Applied Physics Letters
PaperSOLID SOLUTIONS OF WSi//2 WITH TiSi//2 OR TaSi//2: STRUCTURE AND RESISTIVITY.
- P. Gas
- J. Tardy
- et al.
- 1984
- ECS Meeting 1984
Conference paperHIGH TEMPERATURE PROCESS LIMITATIONS ON TiSi//2.
- C.-Y. Ting
- F.M. d'Heurle
- et al.
- 1984
- ECS Meeting 1984
Conference paperFormation of thin films of NiSi: Metastable structure, diffusion mechanisms in intermetallic compounds
- F.M. D'Heurle
- C.S. Petersson
- et al.
- 1984
- Journal of Applied Physics
Paper