Silicon-Rich SiO2 and Thermal SiO2 Dual Dielectric for Yield Improvement and High Capacitance
- Stefan K. C. Lai
- D.J. Dimaria
- et al.
- 1983
- IEEE T-ED
Paper
Publications
119 results for D.J. DiMaria
Study of charge trapping as a degradation mechanism in electrically alterable read-only memories
- C. Falcony
- D.J. DiMaria
- et al.
- 1982
- Journal of Applied Physics
PaperEnhanced electron injection into SiO2 layers using granular metal films
- C. Falcony
- D.J. Dimaria
- et al.
- 1982
- Journal of Applied Physics
PaperExperimental test of the quantum-mechanical image-force theory
- A. Hartstein
- Z.A. Weinberg
- et al.
- 1982
- Physical Review B
PaperExtended Cyclability in Electrically-Alterable Read-Only-Memories
- S.R. Brorson
- D.W. Dong
- et al.
- 1982
- IEEE Electron Device Letters
PaperA New Low-Voltage Si-Compatible Electroluminescent Device
- D.J. Robbins
- C. Falcony
- et al.
- 1982
- IEEE Electron Device Letters
PaperThe effects of water on oxide and interface trapped charge generation in thermal SiO2 films
- F.J. Feigl
- D.R. Young
- et al.
- 1981
- Journal of Applied Physics
PaperEffect of forming gas anneal on Al-SiO2 internal photoemission characteristics
- P. Solomon
- D.J. Dimaria
- 1981
- Journal of Applied Physics
PaperElectrically-alterable read-only-memory using Si-rich SiO2 injectors and a floating polycrystalline silicon storage layer
- D.J. DiMaria
- K.M. DeMeyer
- et al.
- 1981
- Journal of Applied Physics
PaperCapture and release of electrons on Na+-related trapping sites in the SiO2 layer of metal-oxide-semiconductor structures at temperatures between 77 and 296 °K
- D.J. DiMaria
- 1981
- Journal of Applied Physics
Paper